Correlation between Roughness (Ra) and Fractal Dimension (D) Using Artificial Vision Systems for On-Site Inspection

Authors

  • José Gabriel Ayala Landeros Instituto Tecnológico de San Juan del Río
  • Victor Manuel Castaño Meneses Universidad Nacional Autónoma de México, Campus Juriquilla, Querétaro
  • María Blanca Becerra Rodríguez Instituto Tecnológico de San Juan del Río
  • Saulo Servín Guzmán Instituto Tecnológico de San Juan del Río
  • Sonia Elizabeth Román Flores Instituto Tecnológico de San Juan del Río
  • Juan Manuel Olivare Ramírez Universidad Tecnológica de San Juan del Río

DOI:

https://doi.org/10.13053/cys-22-4-2785

Keywords:

Fractal dimension, Wigner distribution, power spectrum, roughness, Poka Yoke

Abstract

A set of images of metal pieces with different finishes was obtained for use as a standard reference in the estimate of the surface roughness (Ra) through the fractal dimension (D) of the power spectrum and the spectrum of intensities. A system of artificial vision with two sources of LED light illumination (white and red) and three angles of incidence was used.  The best results were found with the spectra of intensities regardless of the type of lighting or the angle of incidence.  The values of the fractal dimension were correlated with the surface roughness values obtained with a contact profilometer to build regression curves that are used to estimate the surface roughness on site with a statistical error under 5%. This system could be used as an inspection station to reduce waiting times and unnecessary transport (Poka Yoke System).

Author Biographies

José Gabriel Ayala Landeros, Instituto Tecnológico de San Juan del Río

Jefe de Proyectos de InvestigaciónDepartamento de Ingeniería Industrial

Victor Manuel Castaño Meneses, Universidad Nacional Autónoma de México, Campus Juriquilla, Querétaro

InvestigadorCentro de Física Aplicada y Tecnología Avanzada

María Blanca Becerra Rodríguez, Instituto Tecnológico de San Juan del Río

Jefa del Departamento de Ingeniería Industrial

Saulo Servín Guzmán, Instituto Tecnológico de San Juan del Río

Jefe del Departamento de Ciencias Básicas

Sonia Elizabeth Román Flores, Instituto Tecnológico de San Juan del Río

Jefa del Departamento de Servicios Escolares

Juan Manuel Olivare Ramírez, Universidad Tecnológica de San Juan del Río

Profesor InvestigadorUniversidad Tecnológica de San Juan del Río

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Published

2018-12-30

Issue

Vol. 22 No. 4 (2018): Topic Trends in Computing Research (Guest Editors: A. Aguilar-Meléndez, E. Moya-Sánchez)

Section

Articles

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